SS 2018 WS 2017
SS 2017
SS 2016 WS 2016
Department of Physics
open chemistry
KVL / Klausuren / MAP 1st HS: 17.04  2nd HS: 05.06  sem.br.: 24.07  begin WS: 14.10

4020170009 Introduction to Electron Microscopy  VVZ 

VL
Wed 15-17
weekly NEW 14 2'05 (0) Anna Mogilatenko, Holm Kirmse

Digital- & Präsenz-basierter Kurs

Aims
State-of-the-art electron microscopy and in particular transmission electron microscopy (TEM) allows for elucidating the structure/property relationship of modern materials at the atomic scale. The further downscaling of functional materials as, e.g., nanomaterials and optical and electronic devices, demands the characterization of both, structure and chemical composition at the nanometer scale and even below.
The target of the course is to familiarize the students with the techniques of state-of-the-art electron microscopy. Particularly, the manifold capabilities of TEM and scanning electron microscopy are discussed. Concerning TEM the focus is drawn on the electron diffraction techniques as well as on the imaging techniques as, e.g., diffraction contrast imaging, high-resolution TEM imaging, high-angle annular dark-field (HAADF) scanning TEM imaging, energy-filtered TEM (EFTEM) imaging, electron holography, and electron tomography. Moreover the spectroscopic methods for chemical analysis, viz., electron energy loss spectroscopy and energy dispersive X-ray spectroscopy are introduced.
Requirements
Basic knowledge of X-ray diffraction theory
Basic knowledge of quantum mechanics
Assigned modules
P24.2.e P35.4
Amount, credit points; Exam / major course assessment
2 SWS, 5 SP/ECTS (Arbeitsanteil im Modul für diese Lehrveranstaltung, nicht verbindlich)
Participation in the practical course „electron microscopy - fundamentals and applications"
Other
The course is accompanied by the practical course „electron microscopy - fundamentals and applications" (40544).
Contact
Dr. Anna Mogilatenko, NEW15 3'306
Literature
D.B. Williams, C.B. Carter. Transmission electron microscopy. Plenum Press, New York 1996; ISBN 0-306-45324-X
B. Fultz, J.M. Howe. Transmission electron microscopy and diffractometry of materials. 2nd edition, Springer 2002; ISBN3-540-43764-9
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