4020230012 Introduction to Electron Microscopy
Digital- & Präsenz-basierter Kurs
- classroom language
- EN
- aims
- This course concerns the operation of modern electron microscopes as well as the techniques used in analytical electron microscopy. The following questions will be addressed:
1.) Why doing electron microscopy?
2.) How does an electron microscope work?
3.) How does an electron beam interact with the sample?
4.) Which information can we gain in electron microscopy?
5.) How to use an electron beam as a supercontinuum light source?
Various imaging and analytical methods for structural characterization and investigation of the electronic properties of different material classes are dealt with. By learning about the advantages, disadvantages and requirements of each method, the students are enabled to decide which methods in electron microscopy are the most suitable to address the respective scientific question.
- requirements
- Basic knowledge of quantum mechanics and diffraction theory,
Basic knowledge of solid state physics and electrodynamics
- structure / topics / contents
- -Introduction
-Electron optics
-Set-up and components of transmission electron microscopes
-Electron-matter interaction
-Imaging and diffraction in electron microscopes
-Spectroscopy in electron microscopes
-Nanooptics with fast electrons
- assigned modules
-
P24.2.e
P35.4
- amount, credit points; Exam / major course assessment
- 4 SWS, 6 SP/ECTS (Arbeitsanteil im Modul für diese Lehrveranstaltung, nicht verbindlich)
Participation in the "Practical Course in Electron Microscopy - Basics and Application"
Oral examination possible.
- other
- The course is accompanied by the "Practical Course in Electron Microscopy - Basics and Application" (40540).
This lecture will be held in English.
- contact
- Dr. Franz Schmidt, Fritz-Haber-Institut der Max-Planck-Gesellschaft, Zum Großen Windkanal 2, 12489 Berlin, Tel: +49 30 8413 4413, schmidt@fhi-berlin.mpg.de
- literature
-
D.B. Williams, C.B. Carter. Transmission Electron Microscopy. Springer New York 2009, ISBN 978-0-387-76500-6
B. Fultz, J. Howe. Transmission Electron Microscopy and Diffractometry of Materials. Springer Berlin 2013, ISBN 978-3-642-29760-1
L. Reimer, H. Kohl. Transmission Electron Microscopy. Springer New York 2008, ISBN 978-0-387-40093-8
R.F. Egerton. Electron Energy-Loss Spectroscopy in the Electron Microscope. Springer New York 2011, ISBN 978-1-4419-9582-7
- Moodle link:
- http://moodle.hu-berlin.de/course/view.php?id=118775