Faculty of Mathematics and Natural Sciences Department of Physics auf deutsch

Project-Id-Version: PROJECT VERSION Report-Msgid-Bugs-To: EMAIL@ADDRESS POT-Creation-Date: 2010-05-17 09:04+0200 PO-Revision-Date: 2010-05-17 10:49+0200 Last-Translator: FULL NAME Language-Team: en Plural-Forms: nplurals=2; plural=(n != 1) MIME-Version: 1.0 Content-Type: text/plain; charset=utf-8 Content-Transfer-Encoding: 8bit Generated-By: Babel 1.3
winter sem. 2017
Last update: 22.09.17 15:47:07

WS 2017 SS 2018
WS 2017
WS 2016 SS 2017
Department of Physics
open chemistry
KVL / Klausuren / MAP 1st HS: 16.10  2nd HS: 11.12  sem.br.: 19.02  begin SS: 16.04

40540 Practical Course in Electron Microscopy - Basics and Application  VVZ 

Mon 15-19
weekly NEW 15 0'516 (0) Holm Kirmse
In completion to the lecture on Electron microscopy 40537 the TEM techniques are applied in a hands-on course. Two TEM machines are available. The TEM/STEM Hitachi H-8110 is utilized for conventional techniques. The TEM/STEM JEOL JEM2200FS is used for spectroscopy-based methods.
Attendance of the Lecture on Electron microscopy 40537
Assigned modules
P25.2.c P23.2 P35.4
Amount, credit points; Exam / major course assessment
4 SWS, 5 SP/ECTS (Arbeitsanteil im Modul für diese Lehrveranstaltung, nicht verbindlich)
Dr. Holm Kirmse, NEW15, R. 3'308, Tel. 7641
D.B. Williams, C.B. Carter. Transmission electron microscopy. Plenum Press, New York 1996; ISBN 0-306-45324-X
B. Fultz, J.M. Howe. Transmission electron microscopy and diffractometry of materials. 2nd edition, Springer 2002; ISBN3-540-43764-9
executed on vlvz2 © IRZ Physik, Version 2012.5.0 vom 18.10.2012 Fullscreen