4020205184 Practical Course in Electron Microscopy - Basics and Application
Digital- & Präsenz-basierter Kurs
- classroom language
- DE
- aims
- In completion to the lecture on Electron microscopy 40537 the TEM techniques are applied in a hands-on course. Two TEM machines are available. The TEM/STEM Hitachi H-8110 is utilized for conventional techniques. The TEM/STEM JEOL JEM2200FS is used for spectroscopy-based methods.
- requirements
- Attendance of the Lecture on Electron microscopy 40537
- assigned modules
-
P24.2.e
P25.2.c
P35.4
- amount, credit points; Exam / major course assessment
- 4 SWS, 5 SP/ECTS (Arbeitsanteil im Modul für diese Lehrveranstaltung, nicht verbindlich)
- other
- je nach Vorgabe: Präsenz-PR oder digitale Übungen
- contact
- Dr. Holm Kirmse, NEW15, R. 3'308, Tel. 7641
- literature
-
D.B. Williams, C.B. Carter. Transmission electron microscopy. Plenum Press, New York 1996; ISBN 0-306-45324-X
B. Fultz, J.M. Howe. Transmission electron microscopy and diffractometry of materials. 2nd edition, Springer 2002; ISBN3-540-43764-9