SS 2021 WS 2020
SS 2020
SS 2019 WS 2019 Department of Physics
open chemistry
KVL / Klausuren / MAP 1st HS: 13.04  2nd HS: 01.06  sem.br.: 20.07  begin WS: 17.10

4020200121 Practical Course in Electron Microscopy - Basics and Application      VVZ  

PR
(0SP 4SWS)
Mon 15-19
 weekly NEW 15 0'516 (0) 5 Holm Kirmse

Präsenzkurs

classroom language
DE
aims
In completion to the lecture on Electron microscopy 40537 the TEM techniques are applied in a hands-on course. Two TEM machines are available. The TEM/STEM Hitachi H-8110 is utilized for conventional techniques. The TEM/STEM JEOL JEM2200FS is used for spectroscopy-based methods.
requirements
Attendance of the Lecture on Electron microscopy 40537
assigned modules
P24.2.e P25.2.c P35.4
amount, credit points; Exam / major course assessment
contact
Dr. Holm Kirmse, NEW15, R. 3'308, Tel. 7641
literature
D.B. Williams, C.B. Carter. Transmission electron microscopy. Plenum Press, New York 1996; ISBN 0-306-45324-X
B. Fultz, J.M. Howe. Transmission electron microscopy and diffractometry of materials. 2nd edition, Springer 2002; ISBN3-540-43764-9
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