Faculty of Mathematics and Natural Sciences Department of Chemistry auf deutsch

alles unter Vorbahlt von COVID-19 Maßnahmen
Beachten Sie die Hinweise in den jeweligen Veranstaltungen
summer sem. 2021
Last update: 13.12.21 21:39:34
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SS 2022 WS 2021
SS 2021
SS 2020 WS 2020 Department of Chemistry
open physics
KVL / Klausuren / MAP 1st HS: 12.04  2nd HS: 31.05  sem.br.: 19.07  begin WS: 12.04

4020210178 Introduction to Electron Microscopy      VVZ  

VL
Mon 9-11
 weekly nV or digital (0) Franz Schmidt
UE weekly Franz Schmidt

Digitaler Kurs

classroom language
DE
aims
This course concerns the operation of modern electron microscopes as well as the techniques used in analytical electron microscopy. Various imaging and analytical methods for structural characterisation and investigation of the electronic properties of different material classes are dealt with.
By learning about the advantages, disadvantages and requirements of each method, the students are enabled to decide which methods in electron microscopy are the most suitable to address the respective scientific question.
requirements
Basic knowledge of quantum mechanics and diffraction theory,
Basic knowledge of solid state physics and electrodynamics
structure / topics / contents
Introduction
Electron optics
Electron-matter interaction
Scanning electron microscopy
Transmission electron microscopy
Spectroscopy
Simulation techniques
Applications
assigned modules
P24.2.e P35.4
amount, credit points; Exam / major course assessment
2 SWS, 5 SP/ECTS (Arbeitsanteil im Modul für diese Lehrveranstaltung, nicht verbindlich)
Participation in the "Practical Course in Electron Microscopy - Basics and Application"
Oral examination possible.
other
The course is accompanied by the "Practical Course in Electron Microscopy - Basics and Application" (40540).
This lecture will be held in English.
contact
Dr. Franz Schmidt, IRIS Humboldt Universität, Zum Großen Windkanal 2, 12489 Berlin, Tel.: +49 30 8413 4413, schmidt@fhi-berlin.mpg.de
literature
D.B. Williams, C.B. Carter. Transmission Electron Microscopy. Springer New York 2009, ISBN 978-0-387-76500-6
B. Fultz, J. Howe. Transmission Electron Microscopy and Diffractometry of Materials. Springer Berlin 2013, ISBN 978-3-642-29760-1
L. Reimer, H. Kohl. Transmission Electron Microscopy. Springer New York 2008, ISBN 978-0-387-40093-8
R.F. Egerton. Electron Energy-Loss Spectroscopy in the Electron Microscope. Springer New York 2011, ISBN 978-1-4419-9582-7
Moodle link:
http://moodle.hu-berlin.de/course/view.php?id=101810
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