4020195069 Practical Course in Electron Microscopy - Basics and Application
Digital- & Präsenz-basierter Kurs
- Aims
- In completion to the lecture Introduction to Electron microscopy (4020190133) the TEM techniques are applied in a hands-on course. The course starts with the alignment of the electron optics. Afterwards methods like electron diffraction as well as diffraction contrast and amplitude contrast imaging are performed. Scanning transmission electron microscopy and spectroscopic methods are demonstrated.
- Requirements
- Attendance of the Lecture on Electron microscopy 40537
- Assigned modules
-
P25.2.c
P35.4
- Amount, credit points; Exam / major course assessment
- 2 SWS, 3 SP/ECTS (Arbeitsanteil im Modul für diese Lehrveranstaltung, nicht verbindlich)
see lecture Introduction to Electron Microscopy
- Contact
- Dr. Holm Kirmse, NEW15, R. 3'308, Tel. 7641
- Literature
-
D.B. Williams, C.B. Carter. Transmission electron microscopy. Plenum Press, New York 1996; ISBN 0-306-45324-X
B. Fultz, J.M. Howe. Transmission electron microscopy and diffractometry of materials. 2nd edition, Springer 2002; ISBN3-540-43764-9